Yu-Mi Kim

Investigation of zinc interstitial ions as the origin of anomalous stress-induced hump in amorphous indium gallium zinc oxide thin film transistors

Yu-Mi Kim, Kwang‐Seok Jeong, Ho‐Jin Yun et al. · Applied Physics Letters · 2013 · 41 citations

Engineering, Electrical Engineering, Materials Science +17

Cost effective protection architecture to provide diverse protection demands in Ethernet passive optical network

Yu-Mi Kim, Jung Yul Choi, Jeong-Hee Ryou et al. · 2004 · 39 citations

Engineering, Computer Engineering, Information Technology +11

Crystal Quality Effect on Low-Frequency Noise in ZnO TFTs

Kwang‐Seok Jeong, Yu-Mi Kim, Ho‐Jin Yun et al. · IEEE Electron Device Letters · 2011 · 22 citations

Engineering, Electrical Engineering, Physics +17

Distributed Electric Vehicle Charging Mechanism: A Game-Theoretical Approach

Bokyeong Kim, Mincheol Paik, Yu-Mi Kim et al. · IEEE Transactions on Vehicular Technology · 2022 · 21 citations

Engineering, Computer Science, Systems Engineering +15

Anomalous Stress-Induced Hump Effects in Amorphous Indium Gallium Zinc Oxide TFTs

Yu-Mi Kim, Kwang‐Seok Jeong, Ho‐Jin Yun et al. · Transactions on Electrical and Electronic Materials · 2012 · 19 citations · Full text

Natural Sciences, Materials Science, Physics +12