Tanya Nigam

Reliability of Ultra-Thin Gate Oxide Below 3 nm in the Direct Tunneling Regime

Michel Depas, R. Degraeve, Tanya Nigam et al. · Japanese Journal of Applied Physics · 1997 · 30 citations

Materials Engineering, Direct Tunneling Regime, Electrical Engineering +15

Lifetime Enhancement under High Frequency NBTI measured on Ring Oscillators

Tanya Nigam, Edward B. Harris · 2006 · 23 citations

Electrical Engineering, Engineering, Physics +8

Fast Wafer-Level Stress-and-Sense Methodology for Characterization of Ring-Oscillator Degradation in Advanced CMOS Technologies

A. Kerber, Xinggong Wan, Yang Liu et al. · IEEE Transactions on Electron Devices · 2015 · 20 citations

Ring-oscillator Degradation, Electrical Engineering, Engineering +15

Reliability Characterization of Ring Oscillator Circuits for Advanced CMOS Technologies

A. Kerber, Tanya Nigam, P. Paliwoda et al. · IEEE Transactions on Device and Materials Reliability · 2020 · 20 citations

Reliability, Ro Degradation, Electrical Engineering +13

Self-Heating Effects on Hot Carrier Degradation and Its Impact on Logic Circuit Reliability

P. Paliwoda, Z. Chbili, A. Kerber et al. · IEEE Transactions on Device and Materials Reliability · 2019 · 19 citations

Engineering, Hot Carrier Degradation, Self-heating Effects +18