Yang Liu

Electronic properties of ionizing radiation-induced defects at SiO$$_2$$/Si interface associated with non-trivial excess current splitting

Binghuang Duan, Cen Xiong, Hang Zhou et al. · The European Physical Journal Plus · 2024 · 57 citations

Semiconductors, Semiconductor Technology, Engineering +8

Gamma-Ray Irradiation Induced Dielectric Loss of SiO₂/Si Heterostructures in Through-Silicon Vias (TSVs) by Forming Border Traps

Guanghui Zhang, Zeng-hui Yang, Xiaoshi Li et al. · ACS Applied Electronic Materials · 2024 · 26 citations

Gamma-ray Irradiation, Electrical Engineering, Semiconductor Device +13

Correlation of I<inf>d</inf>- and I<inf>g</inf>-random telegraph noise to positive bias temperature instability in scaled high-κ/metal gate n-type MOSFETs

Chia‐Yu Chen, Qiushi Ran, Hyun‐Jin Cho et al. · 2011 · 24 citations

High-κ Nmosfets, Electrical Engineering, Engineering +10

Fast Wafer-Level Stress-and-Sense Methodology for Characterization of Ring-Oscillator Degradation in Advanced CMOS Technologies

A. Kerber, Xinggong Wan, Yang Liu et al. · IEEE Transactions on Electron Devices · 2015 · 20 citations

Ring-oscillator Degradation, Electrical Engineering, Engineering +15

General Model for Defect Dynamics in Ionizing‐Irradiated SiO₂‐Si Structures

Yu Song, Guanghui Zhang, Xuefen Cai et al. · Small · 2022 · 20 citations