P. Paliwoda

Device reliability metric for end-of-life performance optimization based on circuit level assessment

A. Kerber, P. Srinivasan, S. Cimino et al. · 2017 · 27 citations

Engineering, Computer Engineering, Electrical Engineering +17

Self-Heating Assessment on Bulk FinFET Devices Through Characterization and Predictive Simulation

P. Paliwoda, Prashanth Paramahans Manik, Dhruv Singh et al. · IEEE Transactions on Device and Materials Reliability · 2018 · 21 citations

Engineering, Electrical Engineering, Heat Transfer +16

Reliability Characterization of Ring Oscillator Circuits for Advanced CMOS Technologies

A. Kerber, Tanya Nigam, P. Paliwoda et al. · IEEE Transactions on Device and Materials Reliability · 2020 · 20 citations

Engineering, Electrical Engineering, Electronic Materials +15

Self-Heating Effects on Hot Carrier Degradation and Its Impact on Logic Circuit Reliability

P. Paliwoda, Z. Chbili, A. Kerber et al. · IEEE Transactions on Device and Materials Reliability · 2019 · 19 citations

Engineering, Electrical Engineering, Electronic Materials +15

Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area

M. Toledano-Luque, P. Paliwoda, M. Nour et al. · 2021 · 15 citations

Engineering, Electrical Engineering, Circuit Theory +13