J.‐J. Ganem

Interface and material characterization of thin Al2O3 layers deposited by ALD using TMA/H2O

L.G. Gosset, J.-F. Damlencourt, O. Renault et al. · Journal of Non-Crystalline Solids · 2002 · 128 citations

Natural Sciences, Materials Engineering, Materials Science +11

Tracer study of pore initiation in anodic alumina formed in phosphoric acid

A. Baron-Wiecheć, M.G. Burke, Teruo Hashimoto et al. · Electrochimica Acta · 2013 · 68 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +14

[sup 18]O Tracer Study of Porous Film Growth on Aluminum in Phosphoric Acid

A. Baron-Wiecheć, J.‐J. Ganem, S.J. Garcia-Vergara et al. · Journal of The Electrochemical Society · 2010 · 44 citations

Natural Sciences, Materials Engineering, Materials Science +17

Mechanisms of Thermal Nitridation of Silicon

I. J. R. Baumvol, F. C. Stedile, J.‐J. Ganem et al. · Journal of The Electrochemical Society · 1995 · 38 citations

Engineering, Materials Engineering, Materials Science +17

Limiting Step Involved in the Thermal Growth of Silicon Oxide Films on Silicon Carbide

I. Vickridge, I. Trimaille, J.‐J. Ganem et al. · Physical Review Letters · 2002 · 38 citations · Full text

Engineering, Materials Engineering, Materials Science +17