S. Crémer

MIM capacitance variation under electrical stress

C. Besset, S. Bruyère, S. Blonkowski et al. · Microelectronics Reliability · 2003 · 49 citations

Electrical Engineering, Engineering, Stress-induced Leakage Current +9

Capacitance non-linearity study in Al2O3 MIM capacitors using an ionic polarization model

Stéphane Bécu, S. Crémer, Jean‐Luc Autran · Microelectronic Engineering · 2006 · 27 citations

Materials Science, Solid-state Ionic, Electrical Engineering +7

Single- and two-color infrared focal plane arrays made by MBE in HgCdTe

Jean-Paul Zanatta, P. Ferret, R. Loyer et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2000 · 25 citations

Optical Materials, Engineering, Optical Testing +21

Design and integration of an O-band silicon nitride AWG for CWDM applications

Sylvain Guerber, Charles Baudot, Carlos Alonso-Ramos et al. · 2017 · 12 citations · Full text

Engineering, Low Order Array, Silicon On Insulator +17