Statistics
Publications
46
Citations
1.4K
H-Index
22
Active since
1975
John R. McNeil is an author at University of New Mexico specializing in natural sciences, materials science, and materials engineering.
Publications per year
1975–2008
46
46
Multiparameter grating metrology using optical scatterometry
Christopher J. Raymond, Michael R. Murnane, Steven L. Prins et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1997 · 108 citations
Natural Sciences, Materials Engineering, Materials Science +17
1–5 of 46