Properties of TiO_2 and SiO_2 thin films deposited using ion assisted deposition

John R. McNeil, G. A. Al‐Jumaily, K. C. Jungling, Alan C. Barron

Applied Optics · 1985 · 61 citations · 4 references

Concepts

Abstract

TiO2 and SiO2 films deposited using ion assisted deposition are investigated as a function of ion energy and current density. Optical constants, possible ion source contaminants, and optical scatter are examined for samples deposited at ambient (∼75°C) and elevated (∼250°C) substrate temperatures.

References

4