Concepedia

Shujing Zhao

SZ

Statistics

Publications

9

Citations

235

H-Index

9

Active since

2021

Affiliations

Weifang University(Current)

University of Chinese Academy of Sciences

Chinese Academy of Sciences

Institute of Microelectronics

Tsinghua University

Shujing Zhao is an author at Weifang University specializing in semiconductor devices, materials science, and microelectronics.

ORCID

Publications per year

2021–2024

9

Publications

9

Impact of Interlayer and Ferroelectric Materials on Charge Trapping During Endurance Fatigue of FeFET With TiN/Hf<sub> <i>x</i> </sub>Zr<sub>1-<i>x</i> </sub>O<sub>2</sub>/Interlayer/Si (MFIS) Gate Structure

Fengbin Tian, Shujing Zhao, Hao Xu et al. · IEEE Transactions on Electron Devices · 2021 · 57 citations · Full text

, , +17

Experimental Extraction and Simulation of Charge Trapping During Endurance of FeFET With TiN/HfZrO/SiO<sub>2</sub>/Si (MFIS) Gate Structure

Shujing Zhao, Fengbin Tian, Hao Xu et al. · IEEE Transactions on Electron Devices · 2022 · 54 citations · Full text

, , +17

Investigation of Endurance Degradation Mechanism of Si FeFET With HfZrO Ferroelectric by an In Situ V<sub>th</sub> Measurement

Xianzhou Shao, Junshuai Chai, Fengbin Tian et al. · IEEE Transactions on Electron Devices · 2023 · 28 citations

, , +17

First-principles study of oxygen vacancy defects in orthorhombic Hf0.5Zr0.5O2/SiO2/Si gate stack

Junshuai Chai, Hao Xu, Jinjuan Xiang et al. · Journal of Applied Physics · 2022 · 23 citations · Full text

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Trap Generation in Whole Gate Stacks of FeFET With TiN/Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub>/SiO<sub>x</sub>/Si (MFIS) Gate Structure During Endurance Fatigue

Jiahui Duan, Shujing Zhao, Fengbin Tian et al. · IEEE Transactions on Electron Devices · 2022 · 21 citations

, , +17

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