Jinjuan Xiang

CMOS Scaling for the 5 nm Node and Beyond: Device, Process and Technology

Henry H. Radamson, Yuanhao Miao, Ziwei Zhou et al. · Nanomaterials · 2024 · 86 citations · Full text

The Challenges of Advanced CMOS Process from 2D to 3D

Henry H. Radamson, Yanbo Zhang, Xiaobin He et al. · Applied Sciences · 2017 · 81 citations · Full text

Engineering, Vlsi Design, Computer Architecture +19

FinFET With Improved Subthreshold Swing and Drain Current Using 3-nm Ferroelectric Hf_0.5Zr_0.5O₂

Zhaohao Zhang, Gaobo Xu, Qingzhu Zhang et al. · IEEE Electron Device Letters · 2019 · 78 citations

Materials Science, Electrical Engineering, Magnetic Properties +11

Optimization of Structure and Electrical Characteristics for Four-Layer Vertically-Stacked Horizontal Gate-All-Around Si Nanosheets Devices

Qingzhu Zhang, Jie Gu, Renren Xu et al. · Nanomaterials · 2021 · 68 citations · Full text

Electric Field Gradient‐Controlled Domain Switching for Size Effect‐Resistant Multilevel Operations in HfO₂‐Based Ferroelectric Field‐Effect Transistor

Binjian Zeng, Chen Liu, Siwei Dai et al. · Advanced Functional Materials · 2021 · 66 citations

Non-volatile Memory, Engineering, Ferroelectric Random-access Memory +18