Tai-Yuan Wu

An Ultrathin Forming-Free $\hbox{HfO}_{x}$ Resistance Memory With Excellent Electrical Performance

Yu‐Sheng Chen, Heng-Yuan Lee, Pang-Shiu Chen et al. · IEEE Electron Device Letters · 2010 · 138 citations

Natural Sciences, Materials Engineering, Materials Science +17

A 5ns fast write multi-level non-volatile 1 K bits RRAM memory with advance write scheme

Shyh-Shyuan Sheu, Pei-Chia Chiang, Wen-Pin Lin et al. · 2009 · 79 citations

Engineering, Computer Engineering, Electrical Engineering +13

$\hbox{HfO}_{x}$ Bipolar Resistive Memory With Robust Endurance Using AlCu as Buffer Electrode

Heng Yuan Lee, Pang-Shiu Chen, Tai-Yuan Wu et al. · IEEE Electron Device Letters · 2009 · 58 citations

Engineering, Materials Engineering, Materials Science +13

Fast-Write Resistive RAM (RRAM) for Embedded Applications

Shyh-Shyuan Sheu, Kuo‐Hsing Cheng, Meng‐Fan Chang et al. · IEEE Design & Test of Computers · 2010 · 56 citations

Engineering, Computer Engineering, Electrical Engineering +15

Novel Defects-Trapping ${\rm TaO}_{\rm X}/{\rm HfO}_{\rm X}$ RRAM With Reliable Self-Compliance, High Nonlinearity, and Ultra-Low Current

Yu-Sheng Chen, Heng-Yuan Lee, Pang-Shiu Chen et al. · IEEE Electron Device Letters · 2014 · 54 citations

Engineering, Electrical Engineering, Materials Science +17