C. Raya

Comparison of On-Wafer TRL Calibration to ISS SOLT Calibration With Open-Short De-Embedding up to 500 GHz

Sébastien Frégonèse, Marina Deng, Magali De Matos et al. · IEEE Transactions on Terahertz Science and Technology · 2018 · 50 citations

Engineering, Measurement, Education +19

Scalable Compact Modeling of III–V DHBTs: Prospective Figures of Merit Toward Terahertz Operation

C. Mukherjee, C. Raya, Bertrand Ardouin et al. · IEEE Transactions on Electron Devices · 2018 · 16 citations

Thz Photonics, Terahertz Technology, Engineering +20

From measurement to intrinsic device characteristics: Test structures and parasitic determination

F. Pourchon, C. Raya, N. Derrier et al. · 2008 · 13 citations

Engineering, Measurement, Parasitic Determination +19

A Multiscale TCAD Approach for the Simulation of InP DHBTs and the Extraction of Their Transit Times

Xin Wen, Akshay M. Arabhavi, Olivier Ostinelli et al. · IEEE Transactions on Electron Devices · 2019 · 13 citations

Multiscale Tcad Approach, Engineering, Inp Dhbts +16

Design of On-Wafer TRL Calibration Kit for InP Technologies Characterization up to 500 GHz

Marina Deng, C. Mukherjee, Chandan Yadav et al. · IEEE Transactions on Electron Devices · 2020 · 13 citations · Full text

Engineering, Measurement, Education +19