Chan-Hoon Park

Electrical characteristics of 20-nm junctionless Si nanowire transistors

Chan-Hoon Park, Myung-Dong Ko, Ki Hyun Kim et al. · Solid-State Electronics · 2012 · 158 citations

Engineering, Electrical Engineering, Materials Science +14

Future of plasma etching for microelectronics: Challenges and opportunities

G. S. Oehrlein, Stephan M. Brandstadter, Robert L. Bruce et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2024 · 145 citations · Full text

Engineering, Electrical Engineering, Manufacturing Engineering +15

Fin Width and Bias Dependence of the Response of Triple-Gate MOSFETs to Total Dose Irradiation

Jae-Joon Song, B.K. Choï, En Xia Zhang et al. · IEEE Transactions on Nuclear Science · 2011 · 44 citations

Medicine, Electrical Engineering, Dose-response Modeling +16

Investigation of Low-Frequency Noise Behavior After Hot-Carrier Stress in an n-Channel Junctionless Nanowire MOSFET

Chan-Hoon Park, Myung-Dong Ko, Ki‐Hyun Kim et al. · IEEE Electron Device Letters · 2012 · 31 citations

Engineering, Electrical Engineering, Electronic Materials +16

Analytic Model of S/D Series Resistance in Trigate FinFETs With Polygonal Epitaxy

Chang-Woo Sohn, Chang Yong Kang, Myung-Dong Ko et al. · IEEE Transactions on Electron Devices · 2013 · 26 citations

Engineering, Electrical Engineering, Materials Science +17