En Xia Zhang

Border Traps in MOS Devices

En Xia Zhang · Microelectronics & Computer · 2000 · 248 citations

Electrical Engineering, Engineering, Slow Border Traps +9

Proton-Induced Dehydrogenation of Defects in AlGaN/GaN HEMTs

Jin Chen, Yevgeniy Puzyrev, Cher Xuan Zhang et al. · IEEE Transactions on Nuclear Science · 2013 · 109 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +13

Process Dependence of Proton-Induced Degradation in GaN HEMTs

Tania Roy, En Xia Zhang, Yevgeniy Puzyrev et al. · IEEE Transactions on Nuclear Science · 2010 · 106 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +12

Radiation Effects in AlGaN/GaN HEMTs

Daniel M. Fleetwood, En Xia Zhang, Ronald D. Schrimpf et al. · IEEE Transactions on Nuclear Science · 2022 · 106 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +12

Effects of Applied Bias and High Field Stress on the Radiation Response of GaN/AlGaN HEMTs

Jin Chen, Yevgeniy Puzyrev, Rong Jiang et al. · IEEE Transactions on Nuclear Science · 2015 · 104 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +12