Cher Xuan Zhang

Proton-Induced Dehydrogenation of Defects in AlGaN/GaN HEMTs

Jin Chen, Yevgeniy Puzyrev, Cher Xuan Zhang et al. · IEEE Transactions on Nuclear Science · 2013 · 109 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +13

Bias Dependence of Total Ionizing Dose Effects in SiGe-MOS FinFETs<formula formulatype="inline"> <tex Notation="TeX"/> </formula>

Cher Xuan Zhang, En Xia Zhang, Jordan A. Hachtel et al. · IEEE Transactions on Nuclear Science · 2014 · 68 citations

Total Ionizing Dose, Engineering, Integrated Circuits +17

Effects of Bias on the Irradiation and Annealing Responses of 4H-SiC MOS Devices

Cher Xuan Zhang, En Xia Zhang, Daniel M. Fleetwood et al. · IEEE Transactions on Nuclear Science · 2011 · 48 citations

Materials Engineering, 4H-sic Mos Devices, Electrical Engineering +13

Origins of Low-Frequency Noise and Interface Traps in 4H-SiC MOSFETs

Cher Xuan Zhang, En Xia Zhang, Daniel M. Fleetwood et al. · IEEE Electron Device Letters · 2012 · 44 citations

Semiconductor Technology, Electrical Engineering, Engineering +11

Bias-Temperature Instabilities in 4H-SiC Metal–Oxide–Semiconductor Capacitors

En Xia Zhang, Cher Xuan Zhang, Daniel M. Fleetwood et al. · IEEE Transactions on Device and Materials Reliability · 2012 · 36 citations

Semiconductors, Materials Science, Electrical Engineering +11