Statistics
Publications
18
Citations
591
H-Index
16
Active since
2003
Benjamin French is an author at Intel (United States) specializing in engineering, materials science, and applied physics.
Publications per year
2003–2016
18
18
X-ray photoelectron spectroscopy measurement of the Schottky barrier at the SiC(N)/Cu interface
Sean W. King, Marc French, Milt Jaehnig et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2011 · 50 citations
Materials Science, Electrical Engineering, Semiconductor Device +13
Structural characterization of carbon nanosheets via x-ray scattering
Benjamin French, J. J. Wang, Mingyao Zhu et al. · Journal of Applied Physics · 2005 · 40 citations
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