Milt Jaehnig

X-ray photoelectron spectroscopy measurement of the Schottky barrier at the SiC(N)/Cu interface

Sean W. King, Marc French, Milt Jaehnig et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2011 · 50 citations

Materials Science, Electrical Engineering, Semiconductor Device +13

X-ray photoelectron spectroscopy investigation of the Schottky barrier at low-k a-SiO(C):H/Cu interfaces

Sean W. King, Marc French, Milt Jaehnig et al. · Applied Physics Letters · 2011 · 34 citations

Engineering, Vacuum Device, Semiconductor Device +17

X-ray Photoelectron Spectroscopy Investigation of the Schottky Barrier at a-BN:H∕Cu Interfaces

Sean W. King, Marc French, Jeff Bielefeld et al. · Electrochemical and Solid-State Letters · 2011 · 22 citations

Materials Science, H∕cu Interfaces, Electrical Engineering +9

Valence band offset at the amorphous hydrogenated boron nitride-silicon (100) interface

Sean W. King, Marc French, Jeff Bielefeld et al. · Applied Physics Letters · 2012 · 17 citations

B. French, Boron Nitride, Engineering +10

Valence band offset and Schottky barrier at amorphous boron and boron carbide interfaces with silicon and copper

Sean W. King, Marc French, Guanghai Xu et al. · Applied Surface Science · 2013 · 16 citations

Materials Science, Boron Nitride, Engineering +7