M. Vos - Concepedia

Author

M. Vos

Australian National University ORCID

Also Known As

M Vos, M. De Vos, M. VOS, M. Vos, Maarten Vos, Martijn Vos, Tee, B., Vos, M.

242

Publications

3.1K

Citations

H-Index

101

Concepts

All Affiliations

Australian National University Flinders University Universidade Federal do Rio Grande do Sul Western University

About

M. Vos is an author at Australian National University specializing in engineering, applied physics, and physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	26	83	2K
2	Applied Physics	25	75	1.8K
3	Natural Sciences	20	47	1.2K
4	Education	3	3	46
5	Chemical Engineering	1	1	28

M. Vos

104

Publications

2.5K

Citations

H-Index

Page 1

	Year	Citations
Comparison of Electron and Neutron Compton Scattering from Entangled Protons in a Solid Polymer C. A. Chatzidimitriou‐Dreismann, M. Vos, C. Kleiner, Physical Review Letters	2003	90
Condensed matter electron momentum spectrometer with parallel detection in energy and momentum P. Storer, Robert S. Caprari, S. A. Clark, Review of Scientific Instruments Parallel DetectionEngineeringNuclear PhysicsPhysicsAccelerator Mass Spectrometry	1994	81
Observing atom motion by electron-atom Compton scattering M. Vos Physical Review A EngineeringAtomic Emission SpectroscopyElectron DiffractionElemental MethodElectron Microscopy	2001	81
Modelling of the Forming Limit Band –A new Method to Increase the Robustness in the Simulation of Sheet Metal Forming Processes Dorel Banabic, M. Vos CIRP Annals Materials ScienceEngineeringMechanical EngineeringNumerical SimulationNet-shape Forming	2007	79
Observing electron motion in solids M. Vos, I. E. McCarthy Reviews of Modern Physics EngineeringPhysicsElectron SpectroscopyExperimental TechniqueSpectroscopy	1995	72
Ion-beam-induced damage in silicon studied using variable-energy positrons, Rutherford backscattering, and infrared absorption P. J. Simpson, M. Vos, I. V. Mitchell, Physical review. B, Condensed matter EngineeringIntegrated CircuitsVariable-energy PositronsSilicon On InsulatorSemiconductors	1991	71
Measurement of the band gap by reflection electron energy loss spectroscopy M. Vos, Sean W. King, Benjamin French Journal of Electron Spectroscopy and Related Phenomena EngineeringPhysicsElectron SpectroscopyNatural SciencesSpectroscopy	2016	69
High-energy (<i>e</i>, 2<i>e</i>) spectrometer for the study of the spectral momentum density of materials M. Vos, Graeme Cornish, E. Weigold Review of Scientific Instruments EngineeringAtomic Emission SpectroscopyEnergy-resolved Momentum DensitiesAbsorption SpectroscopyNew Spectrometer	2000	64
Argon incorporation in Si(100) by ion bombardment at 15–100 eV W. M. Lau, I. Bello, L. J. Huang, Journal of Applied Physics Incorporation ProbabilitiesArgon IncorporationIon ImplantationEngineeringPhysics	1993	54
Monte Carlo simulations of (<i>e</i>,2<i>e</i>) experiments on solids M. Vos, Murk J. Bottema Physical review. B, Condensed matter EngineeringMaterial SimulationMonte Carlo MethodsSimulationElectron Diffraction	1996	46

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