E. Mays

Detection of defect states in low-k dielectrics using reflection electron energy loss spectroscopy

Sean W. King, Benjamin French, E. Mays · Journal of Applied Physics · 2013 · 52 citations

Engineering, Defect Tolerance, Band Gap +24

Mechanical properties of high porosity low-<i>k</i>dielectric nano-films determined by Brillouin light scattering

Sheldon T. Bailey, E. Mays, David J. Michalak et al. · Journal of Physics D Applied Physics · 2012 · 47 citations

Engineering, Nanoporous Material, Optoelectronic Devices +20

Defect structure and electronic properties of SiOC:H films used for back end of line dielectrics

T. A. Pomorski, Brad C. Bittel, P. M. Lenahan et al. · Journal of Applied Physics · 2014 · 46 citations

Engineering, X-ray Reflectivity, Electronic Properties +18

Elastic properties of porous low-k dielectric nano-films

Wei Zhou, Sheldon T. Bailey, R. Sooryakumar et al. · Journal of Applied Physics · 2011 · 42 citations

Engineering, Nanoporous Material, Acoustic Metamaterial +16

Nuclear reaction analysis for H, Li, Be, B, C, N, O and F with an RBS check

W. A. Lanford, Mathew Parenti, Bradley J. Nordell et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2015 · 33 citations · Full text

High-energy Nuclear Reaction, Nuclear Physics, Natural Sciences +7