Brad C. Bittel

Defect structure and electronic properties of SiOC:H films used for back end of line dielectrics

T. A. Pomorski, Brad C. Bittel, P. M. Lenahan et al. · Journal of Applied Physics · 2014 · 46 citations

Engineering, X-ray Reflectivity, Electronic Properties +18

Spin dependent charge pumping in SiC metal-oxide-semiconductor field-effect-transistors

Brad C. Bittel, Patrick M. Lenahan, Jason T. Ryan et al. · Applied Physics Letters · 2011 · 35 citations

Spintronics, Electrical Engineering, Magnetism +12

Color center formation in vacuum sintered Nd3xY3−3xAl5O12 transparent ceramics

Adam J. Stevenson, Brad C. Bittel, Christopher G. Leh et al. · Applied Physics Letters · 2011 · 31 citations

Materials Science, Optical Materials, Engineering +11

Ultraviolet radiation effects on paramagnetic defects in low-κ dielectrics for ultralarge scale integrated circuit interconnects

Brad C. Bittel, Patrick M. Lenahan, Sean W. King · Applied Physics Letters · 2010 · 31 citations

Engineering, Integrated Circuits, Electronic Properties +17

Defects and electronic transport in hydrogenated amorphous SiC films of interest for low dielectric constant back end of the line dielectric systems

T. A. Pomorski, Brad C. Bittel, Corey J. Cochrane et al. · Journal of Applied Physics · 2013 · 26 citations

Engineering, Line Dielectric Systems, Magnetic Resonance +22