B. Hornung

Modeled tunnel currents for high dielectric constant dielectrics

Eric M. Vogel, Khaled Ahmed, B. Hornung et al. · IEEE Transactions on Electron Devices · 1998 · 163 citations

Device Modeling, Electrical Engineering, Tunnel Currents +13

Equipment fault detection using spatial signatures

Martha Gardner, Jye‐Chyi Lu, R.S. Gyurcsik et al. · IEEE Transactions on Components Packaging and Manufacturing Technology Part C · 1997 · 64 citations

Fault Diagnosis, Engineering, Measurement +18

Investigation of roughened silicon surfaces using fractal analysis. II. Chemical etching, rapid thermal chemical vapor deposition, and thermal oxidation

L. Spanos, Q. Liu, E. A. Irene et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1994 · 32 citations

Engineering, Microscopy, Mechanical Engineering +19

A reliability methodology for low temperature data retention in floating gate non-volatile memories

Peter Kuhn, A. Hoefler, T. Harp et al. · 2002 · 25 citations

Non-volatile Memory, Engineering, Computer Architecture +16

An enhanced 90nm high performance technology with strong performance improvements from stress and mobility increase through simple process changes

R. Khamankar, H. Bu, C. Bowen et al. · 2004 · 21 citations

Engineering, Vlsi Design, Class Performance +19