Peter Kuhn

A reliability methodology for low temperature data retention in floating gate non-volatile memories

Peter Kuhn, A. Hoefler, T. Harp et al. · 2002 · 25 citations

Engineering, Computer Engineering, Electrical Engineering +16

Statistical modeling of the program/erase cycling acceleration of low temperature data retention in floating gate nonvolatile memories

A. Hoefler, J.M. Higman, T. Harp et al. · 2003 · 24 citations

Engineering, Computer Engineering, Electrical Engineering +15

Effects of heavy ion exposure on nanocrystal nonvolatile memory

Timothy R. Oldham, M. Suhail, Peter Kuhn et al. · IEEE Transactions on Nuclear Science · 2005 · 16 citations · Full text

Engineering, Materials Science, Physics +17

Effects of Fowler Nordheim tunneling stress vs. Channel Hot Electron stress on data retention characteristics of floating gate non-volatile memories

M. Suhail, T. Harp, John Bridwell et al. · 2003 · 15 citations

Engineering, Electrical Engineering, Physics +14

Variation in natural threshold voltage of NVM circuits due to dopant fluctuations and its impact on reliability

David C. Burnett, J.M. Higman, A. Hoefler et al. · 2003 · 12 citations

Engineering, Computer Engineering, Electrical Engineering +17