M. Suhail

Effects of heavy ion exposure on nanocrystal nonvolatile memory

Timothy R. Oldham, M. Suhail, Peter Kuhn et al. · IEEE Transactions on Nuclear Science · 2005 · 16 citations · Full text

Engineering, Materials Science, Physics +17

Effects of Fowler Nordheim tunneling stress vs. Channel Hot Electron stress on data retention characteristics of floating gate non-volatile memories

M. Suhail, T. Harp, John Bridwell et al. · 2003 · 15 citations

Engineering, Electrical Engineering, Physics +14

Embedded split-gate flash memory with silicon nanocrystals for 90nm and beyond

G. Chindalore, Jane Yater, H. Gasquet et al. · 2008 · 14 citations

Engineering, Computer Engineering, Electrical Engineering +16

Highly Optimized Nanocrystal-Based Split Gate Flash for High Performance and Low Power Microcontroller Applications

Jane Yater, Sung Taeg Kang, B. Min et al. · 2011 · 12 citations

Engineering, Computer Engineering, Electrical Engineering +16

High Performance Nanocrystal Based Embedded Flash Microcontrollers with Exceptional Endurance and Nanocrystal Scaling Capability

Sung-Taeg Kang, B. Winstead, Jane Yater et al. · 2012 · 11 citations

Engineering, Computer Engineering, Electrical Engineering +17