Stewart Rose

Microstructural characterization of inlaid copper interconnect lines

Paul R. Besser, Ehrenfried Zschech, Werner Blum et al. · Journal of Electronic Materials · 2001 · 70 citations

Engineering, Electrical Engineering, Materials Engineering +14

The enhancement of adhesive joint strength by extending the surface of anodized aluminium

D. J. Arrowsmith, D. A. Moth, Stewart Rose · International Journal of Adhesion and Adhesives · 1992 · 19 citations

Engineering, Materials Engineering, Materials Science +13

Blech effect in single-inlaid Cu interconnects

S. Thrasher, C. Capasso, Linlin Zhao et al. · 2001 · 17 citations

Natural Sciences, Electrical Engineering, Materials Science +13

<title>EUV mask fabrication with Cr absorber</title>

Pawitter J. S. Mangat, Scott D. Hector, Stewart Rose et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2000 · 14 citations

Engineering, Materials Engineering, Materials Science +17