John D. Cressler

Multiple-Bit Upset in 130 nm CMOS Technology

Alan D. Tipton, Jonathan A. Pellish, Robert A. Reed et al. · IEEE Transactions on Nuclear Science · 2006 · 102 citations

Engineering, Computer Engineering, Electrical Engineering +17

Single Event Upset Mechanisms for Low-Energy-Deposition Events in SiGe HBTs

Enrique Montes, Robert A. Reed, Jonathan A. Pellish et al. · IEEE Transactions on Nuclear Science · 2008 · 34 citations

Engineering, Electrical Engineering, Physics +17

Single Event Transient Response of SiGe Voltage References and Its Impact on the Performance of Analog and Mixed-Signal Circuits

Laleh Najafizadeh, Stanley D. Phillips, Kurt A. Moen et al. · IEEE Transactions on Nuclear Science · 2009 · 34 citations

Engineering, Electrical Engineering, Microelectronics +15

On the Frequency Limits of SiGe HBTs for TeraHertz Applications

Jiahui Yuan, R. Krithivasan, John D. Cressler et al. · Proceedings of the ... Bipolar/BiCMOS Circuits and Technology Meeting/Proceedings of the ... BipolarBiCMOS Circuits and Technology Meeting · 2007 · 22 citations

Engineering, Electrical Engineering, Materials Science +12

Accurate Modeling of Single-Event Transients in a SiGe Voltage Reference Circuit

Kurt A. Moen, Laleh Najafizadeh, Seungwoo Jung et al. · IEEE Transactions on Nuclear Science · 2011 · 20 citations

Engineering, Electrical Engineering, Analog Electronics +16