Kurt A. Moen

Sub-1-K Operation of SiGe Transistors and Circuits

Laleh Najafizadeh, John Adams, S.D. Phillips et al. · IEEE Electron Device Letters · 2009 · 50 citations

Electrical Engineering, Electronic Devices, Engineering +12

Predictive Physics-Based TCAD Modeling of the Mixed-Mode Degradation Mechanism in SiGe HBTs

Kurt A. Moen, Partha Sarathi Chakraborty, Uppili S. Raghunathan et al. · IEEE Transactions on Electron Devices · 2012 · 39 citations

Engineering, Mixed-mode Degradation Mechanism, Semiconductor Device +16

Heavy Ion Microbeam- and Broadbeam-Induced Transients in SiGe HBTs

Jonathan A. Pellish, Robert A. Reed, Dale McMorrow et al. · IEEE Transactions on Nuclear Science · 2009 · 37 citations · Full text

Single Event Transient Response of SiGe Voltage References and Its Impact on the Performance of Analog and Mixed-Signal Circuits

Laleh Najafizadeh, Stanley D. Phillips, Kurt A. Moen et al. · IEEE Transactions on Nuclear Science · 2009 · 33 citations

Engineering, Vlsi Design, Nuclear Physics +22

Single-Event Response of the SiGe HBT Operating in Inverse-Mode

S.D. Phillips, Kurt A. Moen, Nelson E. Lourenco et al. · IEEE Transactions on Nuclear Science · 2012 · 29 citations

Engineering, Bulk Sige Platform, Integrated Circuits +16