Stanley D. Phillips - Concepedia

Author

Stanley D. Phillips

Georgia Institute of Technology

Also Known As

Stanley D Phillips, Stanley D. Phillips, Stanley Phillips

Publications

386

Citations

H-Index

Concepts

All Affiliations

Georgia Institute of Technology Sandia National Laboratories Goddard Space Flight Center United States Naval Research Laboratory IBM (United States)

About

Stanley D. Phillips is an author at Georgia Institute of Technology specializing in microelectronics, electrical engineering, and engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	12	13	278
2	Applied Physics	8	8	158
3	Computer Engineering	7	7	143
4	Natural Sciences	2	2	58
5	Medicine	1	1	28

Stanley D. Phillips

Publications

315

Citations

H-Index

Page 1

	Year	Citations
Laser-Induced Current Transients in Silicon-Germanium HBTs Jonathan A. Pellish, Robert A. Reed, Dale McMorrow, IEEE Transactions on Nuclear Science Transient GratingPhotonicsElectrical EngineeringEngineeringPhysics	2008	40
Heavy Ion Microbeam- and Broadbeam-Induced Transients in SiGe HBTs Jonathan A. Pellish, Robert A. Reed, Dale McMorrow, IEEE Transactions on Nuclear Science	2009	37
Single Event Transient Response of SiGe Voltage References and Its Impact on the Performance of Analog and Mixed-Signal Circuits Laleh Najafizadeh, Stanley D. Phillips, Kurt A. Moen, IEEE Transactions on Nuclear Science EngineeringVlsi DesignNuclear PhysicsAnalog DesignSige Bicmos Technology	2009	33
Total Dose and Transient Response of SiGe HBTs from a New 4th-Generation, 90 nm SiGe BiCMOS Technology Nelson E. Lourenco, Robert L. Schmid, Kurt A. Moen, Total Ionizing DoseEngineeringNuclear PhysicsTotal DoseIon Beam Instrumentation	2012	28
A Novel Device Architecture for SEU Mitigation: The Inverse-Mode Cascode SiGe HBT Stanley D. Phillips, Tushar Thrivikraman, Aravind Appaswamy, IEEE Transactions on Nuclear Science EngineeringVlsi DesignNuclear PhysicsElectronic DesignIon Beam Instrumentation	2009	25
An Investigation of Single-Event Effects and Potential SEU Mitigation Strategies in Fourth-Generation, 90 nm SiGe BiCMOS Nelson E. Lourenco, Stanley D. Phillips, Troy England, IEEE Transactions on Nuclear Science EngineeringVlsi DesignSingle-event EffectsIntegrated CircuitsNm Sige Bicmos	2013	24
Evaluation of Enhanced Low Dose Rate Sensitivity in Fourth-Generation SiGe HBTs Zachary E. Fleetwood, Adilson S. Cardoso, Ickhyun Song, IEEE Transactions on Nuclear Science Electrical EngineeringEngineeringTechnology GenerationRf SemiconductorHigh-frequency Device	2014	22
Design of Digital Circuits Using Inverse-Mode Cascode SiGe HBTs for Single Event Upset Mitigation Tush Thrivikraman, Edward P. Wilcox, Stanley D. Phillips, IEEE Transactions on Nuclear Science EngineeringVlsi DesignElectronic DesignIon Beam InstrumentationIntegrated Circuits	2010	22
A Theory of Single-Event Transient Response in Cross-Coupled Negative Resistance Oscillators Stephen Horst, Stanley D. Phillips, Prabir Saha, IEEE Transactions on Nuclear Science Potential ImpactElectrical EngineeringEngineeringPhysicsNonlinear Circuit	2010	21
Evaluating the Influence of Various Body-Contacting Schemes on Single Event Transients in 45-nm SOI CMOS Kurt A. Moen, Stanley D. Phillips, Edward P. Wilcox, IEEE Transactions on Nuclear Science EngineeringVlsi DesignIntegrated CircuitsMicrobeam-induced TransientsHigh-power Lasers	2010	14

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