Brigitte Parmentier

New low-stress PECVD poly-SiGe layers for MEMS

Cristina Rusu, Sherif Sedky, Brigitte Parmentier et al. · Journal of Microelectromechanical Systems · 2003 · 47 citations

Engineering, Thin Film Process Technology, Plasma Processing +19

Characterization of Epitaxial Si:C:P and Si:P Layers for Source/Drain Formation in Advanced Bulk FinFETs

Erik Rosseel, Harald B. Profijt, Andriy Hikavyy et al. · ECS Transactions · 2014 · 46 citations · Full text

Engineering, Silicon On Insulator, Semiconductor Device +16

In Situ Phosphorus Doping of Germanium by APCVD

Gabriela Dilliway, Ruud van den BOOM, Alain Moussa et al. · ECS Transactions · 2006 · 27 citations

Materials Engineering, Materials Science, Chemical Engineering +14

Electrical characterizations and evaluation of thermo-mechanical stresses of a power module dedicated to high temperature applications

Laurent Dupont, Z. Khatir, Sébastien Lefebvre et al. · 2005 · 16 citations · Full text

Engineering, Mechanical Engineering, Power Electronic Systems +23

Advanced carrier depth profiling on Si and Ge with micro four-point probe

Trudo Clarysse, Pierre Eyben, Brigitte Parmentier et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2008 · 13 citations

Engineering, Measurement, Education +17