Tong-Chern Ong

A 22nm 96KX144 RRAM Macro with a Self-Tracking Reference and a Low Ripple Charge Pump to Achieve a Configurable Read Window and a Wide Operating Voltage Range

Chung-Cheng Chou, Zheng-Jun Lin, Chien-An Lai et al. · 2020 · 55 citations

Hardware Security, Non-volatile Memory, Electrical Engineering +12

50-Å gate-Oxide MOSFET's at 77 K

Tong-Chern Ong, P.K. Ko, Chenming Hu · IEEE Transactions on Electron Devices · 1987 · 48 citations

Cycling endurance optimization scheme for 1Mb STT-MRAM in 40nm technology

Hung-Chang Yu, Kai-Chun Lin, Ku-Feng Lin et al. · 2013 · 40 citations

Non-volatile Memory, Engineering, Emerging Memory Technology +16

P-MOSFET Gate Current and Device Degradation

Tong-Chern Ong, Koichi Seki, P.K. Ko et al. · Reliability physics · 1989 · 27 citations

Electrical Engineering, Engineering, P-mosfet Gate Current +4

The positive trigger voltage lowering effect for latch-up

Jian‐Hsing Lee, Wu‐Te Weng, Jiaw‐Ren Shih et al. · 2004 · 16 citations

Low-power Electronics, Electrical Engineering, Engineering +5