C. Dennison

A floating gate based 3D NAND technology with CMOS under array

Krishna Parat, C. Dennison · 2015 · 111 citations

Engineering, Computer Engineering, Electrical Engineering +14

Discontinuity of B-diffusion profiles at the interface of polycrystalline Si and single crystal Si

S. Batra, Monte Manning, C. Dennison et al. · Journal of Applied Physics · 1993 · 19 citations

Engineering, Materials Engineering, Materials Science +16

MOCVD $\hbox{Ge}_{3}\hbox{Sb}_{2}\hbox{Te}_{5}$ for PCM Applications

J. F. Zheng, J.R. Reed, Carl Schell et al. · IEEE Electron Device Letters · 2010 · 16 citations

Engineering, Materials Engineering, Materials Science +17

Hot-carrier reliability characteristics of narrow-width MOSFETs

Hyunsang Hwang, Jack C. Lee, P. Fazan et al. · Solid-State Electronics · 1993 · 12 citations

Engineering, Electrical Engineering, Microelectronics +13