A. M. Roskowski

BTI reliability of 45 nm high-K + metal-gate process technology

Sangwoo Pae, M. Agostinelli, M. Brazier et al. · 2008 · 131 citations

Engineering, Electrical Engineering, Materials Science +17

Gallium nitride and related materials: challenges in materials processing

R. F. Davis, S. Einfeldt, Edward A. Preble et al. · Acta Materialia · 2003 · 62 citations

Engineering, Materials Engineering, Materials Science +14

Gallium nitride materials - progress, status, and potential roadblocks

R. F. Davis, A. M. Roskowski, Edward A. Preble et al. · Proceedings of the IEEE · 2002 · 44 citations

Engineering, Materials Engineering, Materials Science +17

A 65nm ultra low power logic platform technology using uni-axial strained silicon transistors

C.-H. Jan, Jaeseok Choi, G. Curello et al. · 2006 · 43 citations

Engineering, Computer Engineering, Electrical Engineering +17

Strain and crystallographic tilt in uncoalesced GaN layers grown by maskless pendeoepitaxy

S. Einfeldt, A. M. Roskowski, Edward A. Preble et al. · Applied Physics Letters · 2002 · 41 citations

Natural Sciences, Materials Engineering, Materials Science +17