K. Fritz

Autonomous bit error rate testing at multi-gbit/s rates implemented in a 5AM SiGe circuit for radiation effects self test (CREST)

Paul W. Marshall, Martin A. Carts, Steve Currie et al. · IEEE Transactions on Nuclear Science · 2005 · 99 citations

Engineering, Vlsi Design, Mem Testing +17

Heavy-ion broad-beam and microprobe studies of single-event upsets in 0.20-/spl mu/m SiGe heterojunction bipolar transistors and circuits

Robert A. Reed, Paul W. Marshall, J.C. Pickel et al. · IEEE Transactions on Nuclear Science · 2003 · 69 citations

Engineering, Vlsi Design, Single-event Upsets +17

An SEU hardening approach for high-speed SiGe HBT digital logic

R. Krithivasan, Guofu Niu, John D. Cressler et al. · IEEE Transactions on Nuclear Science · 2003 · 54 citations

Hardware Security, Low-power Electronics, Electrical Engineering +14

A comparative study of heavy-ion and proton-induced bit-error sensitivity and complex burst-error modes in commercially available high-speed SiGe BiCMOS

Paul W. Marshall, Martin A. Carts, A.B. Campbell et al. · IEEE Transactions on Nuclear Science · 2004 · 36 citations

Engineering, Vlsi Design, Proton See Data +18

A 20 GS/s 5-Bit SiGe BiCMOS Dual-Nyquist Flash ADC With Sampling Capability up to 35 GS/s Featuring Offset Corrected Exclusive-Or Comparators

R.A. Kertis, Jim S. Humble, Mary A. Daun-Lindberg et al. · IEEE Journal of Solid-State Circuits · 2009 · 23 citations

Electrical Engineering, Engineering, Data Converter +11