F. Danneville

A 4-fJ/Spike Artificial Neuron in 65 nm CMOS Technology

Ilias Sourikopoulos, Sara Hedayat, Christophe Loyez et al. · Frontiers in Neuroscience · 2017 · 207 citations · Full text

A new method for on wafer noise measurement

G. Dambrine, H. Happy, F. Danneville et al. · IEEE Transactions on Microwave Theory and Techniques · 1993 · 119 citations

Electrical Engineering, Engineering Noise Control, Engineering +14

What are the limiting parameters of deep-submicron MOSFETs for high frequency applications?

G. Dambrine, C. Raynaud, Dimitri Lederer et al. · IEEE Electron Device Letters · 2003 · 119 citations

Device Modeling, Low-power Electronics, Electrical Engineering +15

Compact-Modeling Solutions For Nanoscale Double-Gate and Gate-All-Around MOSFETs

B. Iñíguez, Tor A. Fjeldly, A. Lázaro et al. · IEEE Transactions on Electron Devices · 2006 · 103 citations

Device Modeling, Electrical Engineering, Compact-modeling Solutions +14

An accurate and efficient high frequency noise simulation technique for deep submicron MOSFETs

R.W. Dutton, T.H. Lee, H. Iwai et al. · IEEE Transactions on Electron Devices · 2000 · 72 citations

Device Modeling, Electrical Engineering, Engineering +10