22nm FDSOI technology for emerging mobile, Internet-of-Things, and RF applications

R. Carter, J. Mazurier, Luca Pirro, +33

EngineeringVlsi DesignRadio FrequencyFinfet TechnologyIntegrated Circuits +14

Performance and Low-Frequency Noise of 22-nm FDSOI Down to 4.2 K for Cryogenic Applications

Bruna Cardoso Paz, M. Cassé, Christoforos Theodorou, +7

IEEE Transactions on Electron Devices

EngineeringVlsi DesignBack Bias ImpactLow-frequency NoiseSemiconductor Device +15

Endurance improvements and defect characterization in ferroelectric FETs through interface fluorination

Yannick Raffel, Ricardo Olivo, Maximilian Lederer, +11

Magnetic PropertiesInterface FluorinationEngineeringFerroelectric Random-access MemoryFerroelectric Application +15

Synergistic Approach of Interfacial Layer Engineering and READ-Voltage Optimization in HfO₂-Based FeFETs for In-Memory-Computing Applications

Yannick Raffel, Sourav De, Maximilian Lederer, +9

ACS Applied Electronic Materials

1F-1T Array: Current Limiting Transistor Cascoded FeFET Memory Array for Variation Tolerant Vector-Matrix Multiplication Operation

Masud Rana Sk, Sunanda Thunder, Franz Müller, +11

IEEE Transactions on Nanotechnology

EngineeringVlsi DesignEmerging Memory TechnologyComputer ArchitectureFerroelectric Random-access Memory +14

Interfacial Layer Engineering to Enhance Noise Immunity of FeFETs for IMC Applications

Yannick Raffel, Sunanda Thunder, Maximilian Lederer, +10

MagnetismElectrical EngineeringSemiconductor DeviceEngineeringImc Applications +12

Interface trap density evaluation on bare silicon-on-insulator wafers using the quasi-static capacitance technique

Luca Pirro, I. Ionica, G. Ghibaudo, +3

Journal of Applied Physics

Device ModelingElectrical EngineeringSemiconductor DeviceEngineeringInterface Quality +13

RF-pFET in fully depleted SOI demonstrates 420 GHz F_T

Josef Watts, K. Sundaram, Kok Wai Chew, +17

SemiconductorsElectrical EngineeringSige CondensationEngineeringPhysics +11

Split-CV for pseudo-MOSFET characterization: Experimental setups and associated parameter extraction methods

Luca Pirro, I. Ionica, G. Ghibaudo, +1

EngineeringBare SoiExperimental SetupsPower ElectronicsExperimental Setup +20

Impact of Channel Implant Variation on RTN and Flicker Noise

Yannick Raffel, Konrad Seidel, Luca Pirro, +5