E. Misra

Failure mechanisms of pure silver, pure aluminum and silver–aluminum alloy under high current stress

E. Misra, N. David Theodore, J. W. Mayer et al. · Microelectronics Reliability · 2006 · 21 citations

Engineering, Materials Engineering, Materials Science +15

Influence of Joule heating during electromigration evaluation of silver lines

T. L. Alford, E. Misra, Shekhar Bhagat et al. · Thin Solid Films · 2008 · 21 citations

Engineering, Electrical Engineering, Materials Engineering +14

Failure mechanisms of silver and aluminum on titanium nitride under high current stress

E. Misra, C. Marenco, N. David Theodore et al. · Thin Solid Films · 2004 · 16 citations

Natural Sciences, Materials Engineering, Materials Science +15

Evaluation of diffusion barrier and electrical properties of tantalum oxynitride thin films for silver metallization

E. Misra, Y. Wang, N. David Theodore et al. · Thin Solid Films · 2004 · 15 citations

Natural Sciences, Materials Engineering, Materials Science +17

Effectiveness of reactive sputter-deposited Ta–N films as diffusion barriers for Ag metallization

Daniel Adams, Gerald F. Malgas, N. David Theodore et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2004 · 15 citations

Natural Sciences, Materials Engineering, Materials Science +17