T. L. Alford

Experimental methods in chemical engineering: X‐ray diffraction spectroscopy—<scp>XRD</scp>

H.R. Khan, Aditya S. Yerramilli, Adrien D’Oliveira et al. · The Canadian Journal of Chemical Engineering · 2020 · 314 citations

X-ray Crystallography, X-ray Spectroscopy, Engineering +17

Improved conductivity and mechanism of carrier transport in zinc oxide with embedded silver layer

Hauk Han, N. David Theodore, T. L. Alford · Journal of Applied Physics · 2008 · 234 citations

Optical Materials, Engineering, Single Zno Layer +19

Thickness dependence on the thermal stability of silver thin films

H.C. Kim, T. L. Alford, David R. Allee · Applied Physics Letters · 2002 · 195 citations

Thin Film Physics, Engineering, Ag Thin Films +16

Effect of Ag thickness on electrical transport and optical properties of indium tin oxide–Ag–indium tin oxide multilayers

Anil Indluru, T. L. Alford · Journal of Applied Physics · 2009 · 158 citations

Optical Materials, Engineering, Surface Nanotechnology +18

Enhanced adhesion of copper to dielectrics via titanium and chromium additions and sacrificial reactions

Stephen W. Russell, S.A. Rafalski, R.L. Spreitzer et al. · Thin Solid Films · 1995 · 137 citations

Materials Science, Chemical Engineering, Electromigration Technique +8