Daniel Adams

A study of the NiSi to NiSi2 transition in the Ni–Si binary system

B.A. Julies, D. Knoesen, R. Pretoriüs et al. · Thin Solid Films · 1999 · 123 citations

Ii-vi Semiconductor, Ni–si Binary System, Engineering +6

Follow-up of Incidental Pulmonary Nodules and the Radiology Report

Denitza Blagev, James F. Lloyd, Karen Conner et al. · Journal of the American College of Radiology · 2013 · 116 citations

Radiology Report, Multiple Pulmonary Nodule, Diagnosis +5

Characterization of the physical and electrical properties of Indium tin oxide on polyethylene napthalate

Hauk Han, Daniel Adams, J. W. Mayer et al. · Journal of Applied Physics · 2005 · 95 citations

Thin Film Physics, Optical Materials, Engineering +23

Encapsulation of Ag films on SiO2 by Ti reactions using Ag–Ti alloy/bilayer structures and an NH3 ambient

T. L. Alford, Daniel Adams, Thomas Laursen et al. · Applied Physics Letters · 1996 · 85 citations

Engineering, Encapsulation Process, Surface Nanotechnology +19

Thermally Induced Transverse Cracking in Graphite-Epoxy Cross-Ply Laminates

Daniel Adams, David Bowles, Carl T. Herakovich · Journal of Reinforced Plastics and Composites · 1986 · 82 citations

Materials Science, High Temperature Materials, Engineering +12