Shekhar Bhagat

Influence of Cu diffusion conditions on the switching of Cu–SiO2-based resistive memory devices

S. Puthen Thermadam, Shekhar Bhagat, T. L. Alford et al. · Thin Solid Films · 2009 · 86 citations · Full text

Engineering, Materials Engineering, Materials Science +12

Tungsten–titanium diffusion barriers for silver metallization

Shekhar Bhagat, Hauk Han, T. L. Alford · Thin Solid Films · 2006 · 51 citations

Natural Sciences, Materials Engineering, Materials Science +13

Structural details of Ge‐rich and silver‐doped chalcogenide glasses for nanoionic nonvolatile memory

M. Mitkova, Yoshifumi Sakaguchi, D. A. Ténné et al. · physica status solidi (a) · 2010 · 35 citations

Natural Sciences, Materials Science, Physics +17

Thermal stability of tungsten–titanium diffusion barriers for silver metallization

Shekhar Bhagat, N. David Theodore, T.L. Alford · Thin Solid Films · 2008 · 27 citations

Natural Sciences, Materials Engineering, Materials Science +16

Structure of copper-doped tungsten oxide films for solid-state memory

C. Gopalan, Michael N. Kozicki, Shekhar Bhagat et al. · Journal of Non-Crystalline Solids · 2007 · 27 citations

Natural Sciences, Materials Engineering, Materials Science +11