Isabella Mica

Proximity gettering of slow diffuser contaminants in CMOS image sensors

Felice Russo, G. Moccia, G. Nardone et al. · Solid-State Electronics · 2013 · 44 citations

Engineering, Electrical Engineering, Materials Science +16

Thermoreflectance temperature imaging of integrated circuits: calibration technique and quantitative comparison with integrated sensors and simulations

Gilles Tessier, S. Pavageau, C. Filloy et al. · Journal of Physics D Applied Physics · 2006 · 42 citations

Engineering, Electrical Engineering, Materials Science +17

Crystal defects and junction properties in the evolution of device fabrication technology

Isabella Mica, M. L. Polignano, G.P. Carnevale et al. · Journal of Physics Condensed Matter · 2002 · 26 citations

Engineering, Electrical Engineering, Materials Science +17

Photoluminescence Imaging for Buried Defects Detection in Silicon: Assessment and Use-Cases

Romain Duru, Delphine Le Cunff, Maxime Cannac et al. · IEEE Transactions on Semiconductor Manufacturing · 2018 · 19 citations

Engineering, Electrical Engineering, Manufacturing Engineering +17

A comparative analysis of different measurement techniques to monitor metal and organic contamination in silicon device processing

M. L. Polignano, Davide Codegoni, Salvatore Grasso et al. · physica status solidi (a) · 2015 · 10 citations

Natural Sciences, Materials Engineering, Materials Science +17