M. L. Polignano

Gettering mechanisms in silicon

M. L. Polignano, G. F. Cerofolini, H. Bender et al. · Journal of Applied Physics · 1988 · 90 citations

Materials Science, Materials Engineering, Defect Tolerance +14

Proximity gettering of slow diffuser contaminants in CMOS image sensors

Felice Russo, G. Moccia, G. Nardone et al. · Solid-State Electronics · 2013 · 44 citations

Proximity Gettering, Engineering, Applied Physics +3

Thermoreflectance temperature imaging of integrated circuits: calibration technique and quantitative comparison with integrated sensors and simulations

Gilles Tessier, M. L. Polignano, S. Pavageau et al. · Journal of Physics D Applied Physics · 2006 · 42 citations

Engineering, Microscopy, Integrated Circuits +24

A comparison of gettering techniques for very large scale integration

G. F. Cerofolini, M. L. Polignano · Journal of Applied Physics · 1984 · 36 citations

Engineering, Mechanical Engineering, Large Scale Integration +20

Generation-recombination phenomena in almost ideal silicon <i>p</i>-<i>n</i> junctions

G. F. Cerofolini, M. L. Polignano · Journal of Applied Physics · 1988 · 31 citations

Semiconductors, Semiconductor Technology, Electrical Engineering +14