A. Sabbadini - Concepedia

Author

A. Sabbadini

STMicroelectronics (Italy)

Also Known As

A Sabbadini, A. Sabbadini, Anna Sabbadini

Publications

153

Citations

H-Index

Concepts

All Affiliations

STMicroelectronics (Italy)STMicroelectronics (Switzerland)University of Catania Institute for Microelectronics and Microsystems

About

A. Sabbadini is an author at STMicroelectronics (Italy) specializing in engineering, materials science, and corrosion.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	7	7	122
2	Applied Physics	4	4	58
3	Chemical Engineering	2	2	43
4	Education	1	1	18
5	Natural Sciences	1	1	11

A. Sabbadini

Publications

122

Citations

H-Index

Page 1

	Year	Citations
Comparison among lifetime techniques for the detection of transition metal contamination M. L. Polignano, F. Cazzaniga, A. Sabbadini, Materials Science and Engineering B Materials ScienceChemical EngineeringEnvironmental ChemistryEngineeringCorrosion	1996	28
Quantitative evaluation of bulk-diffused metal contamination by lifetime techniques M. L. Polignano, Enrico Bellandi, D. Lodi, Materials Science and Engineering B EngineeringCorrosionEnvironmental EngineeringMetal ContaminationMetallurgical Process	1998	18
Metal contamination monitoring and gettering M. L. Polignano, F. Cazzaniga, A. Sabbadini, Materials Science in Semiconductor Processing Materials ScienceEnvironmental MonitoringEngineeringCorrosionEnvironmental Engineering	1998	18
Supersoft elastic parameters and low melting temperature of the C49 phase in TiSi2 by Brillouin scattering and molecular dynamics Leo Miglio, Marcella Iannuzzi, Massimo Celino, Applied Physics Letters Supersoft Elastic ParametersEngineeringSolid-state ChemistryMolecular DynamicsMaterial Physic	1999	18
<title>Investigation of metal contamination by photocurrent measurements: validation and application to ion implantation processes</title> M. L. Polignano, C. Bresolin, F. Cazzaniga, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE EngineeringPhotocurrent MeasurementsAtomic Emission SpectroscopyMetal ContaminationChemistry	1995	15
Initial reactions in Ti–Si bilayers: New indications from <i>in situ</i> measurements R. Cocchi, D. Giubertoni, G. Ottaviani, Journal of Applied Physics EngineeringTi–si BilayerThin Film Process TechnologyInitial ReactionsNew Indications	2001	14
Micro-Raman study of the factors limiting the TiSi <sub>2</sub> C54 phase formation in submicron patterns Francesco Meinardi, L. Moro, A. Sabbadini, Europhysics Letters (EPL) EngineeringChemistryNanometrologyMicro-raman StudyNanoscale Science	1998	11

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