Romain Duru

$1.62\mu \mathrm{m}$ Global Shutter Quantum Dot Image Sensor Optimized for Near and Shortwave Infrared

Jonathan S. Steckel, E. Josse, Andras G. Pattantyus‐Abraham et al. · 2021 IEEE International Electron Devices Meeting (IEDM) · 2021 · 52 citations

Natural Sciences, Materials Engineering, Materials Science +17

Fully Depleted, Trench-Pinned Photo Gate for CMOS Image Sensor Applications

F. Roy, Andrej Suler, Thomas Dalleau et al. · Sensors · 2020 · 21 citations · Full text

Engineering, Electrical Engineering, Microelectronics +16

Hydrogen passivation of silicon/silicon oxide interface by atomic layer deposited hafnium oxide and impact of silicon oxide underlayer

Evan Oudot, M. Gros‐Jean, Kristell Courouble et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2017 · 19 citations

Engineering, Materials Engineering, Materials Science +17

Photoluminescence Imaging for Buried Defects Detection in Silicon: Assessment and Use-Cases

Romain Duru, Delphine Le Cunff, Maxime Cannac et al. · IEEE Transactions on Semiconductor Manufacturing · 2018 · 19 citations

Engineering, Electrical Engineering, Manufacturing Engineering +17

Oxidation kinetics of Si and SiGe by dry rapid thermal oxidation, <i>in-situ</i> steam generation oxidation and dry furnace oxidation

Fabien Rozé, Olivier Gourhant, E. Blanquet et al. · Journal of Applied Physics · 2017 · 16 citations

Natural Sciences, Materials Engineering, Materials Science +17