F. Roy

Impact of Random Telegraph Signal in CMOS Image Sensors for Low-Light Levels

C. Leyris, F. Mart́ınez, M. Valenza et al. · Proceedings of ESSCIRC · 2006 · 65 citations

Engineering, Computer Engineering, Electrical Engineering +17

CMOS image sensor: Process impact on dark current

J-P. Carrère, S. Placé, J.-P. Oddou et al. · 2014 · 54 citations

Engineering, Electrical Engineering, Microelectronics +16

<i>In situ</i> determination of the static inductance and resistance of a plasma focus capacitor bank

S. H. Saw, S. Lee, F. Roy et al. · Review of Scientific Instruments · 2010 · 53 citations

Engineering, Electrical Engineering, Physics +16

Fully Optimized Cu based process with dedicated cavity etch for 1.75&amp;amp;#x003BC;m and 1.45&amp;amp;#x003BC;m pixel pitch CMOS Image Sensors

Muriel Cohen, F. Roy, Didier Hérault et al. · 2006 · 45 citations · Full text

Engineering, Electrical Engineering, Microelectronics +16

Measurement and Processing of Fast Pulsed Discharge Current in Plasma Focus Machines

S. Lee, S. H. Saw, Rajdeep Singh Rawat et al. · Journal of Fusion Energy · 2011 · 37 citations

Natural Sciences, Electrical Engineering, Physics +11