M. Valenza

Overview of the impact of downscaling technology on 1∕f noise in p-MOSFETs to 90 nm

M. Valenza, A. Hoffmann, D. Sodini et al. · IEE Proceedings - Circuits Devices and Systems · 2004 · 79 citations

Engineering, Electrical Engineering, Circuit Theory +16

Impact of Random Telegraph Signal in CMOS Image Sensors for Low-Light Levels

C. Leyris, F. Mart́ınez, M. Valenza et al. · Proceedings of ESSCIRC · 2006 · 65 citations

Engineering, Computer Engineering, Electrical Engineering +17

Low frequency noise in thin film transistors

D. Rigaud, J. Rhayem, M. Valenza · IEE Proceedings - Circuits Devices and Systems · 2002 · 63 citations

Engineering, Electrical Engineering, Materials Science +17

1/f noise investigations in small channel length amorphous silicon thin film transistors

J. Rhayem, M. Valenza, D. Rigaud et al. · Journal of Applied Physics · 1998 · 44 citations

Engineering, Electrical Engineering, Microelectronics +16

1/f noise modeling in long channel amorphous silicon thin film transistors

J. Rhayem, D. Rigaud, M. Valenza et al. · Journal of Applied Physics · 2000 · 43 citations

Engineering, Electrical Engineering, Materials Science +17