F. Mart́ınez

Overview of the impact of downscaling technology on 1∕f noise in p-MOSFETs to 90 nm

M. Valenza, A. Hoffmann, D. Sodini et al. · IEE Proceedings - Circuits Devices and Systems · 2004 · 79 citations

Impact of Random Telegraph Signal in CMOS Image Sensors for Low-Light Levels

C. Leyris, F. Mart́ınez, M. Valenza et al. · Proceedings of ESSCIRC · 2006 · 65 citations

Photoelectric Sensor, Engineering, Random Telegraph Signal +10

N-MOSFET oxide trap characterization induced by nitridation process using RTS noise analysis

C. Leyris, F. Mart́ınez, A. Hoffmann et al. · Microelectronics Reliability · 2006 · 38 citations

Rts Noise Analysis, Electrical Engineering, Engineering +5

Supercoupling effect in short-channel ultrathin fully depleted silicon-on-insulator transistors

Carlos Navarro, M. Bawedin, F. Andrieu et al. · Journal of Applied Physics · 2015 · 32 citations

Electrical Engineering, Engineering, Physics +11

Electrical modeling of InSb PiN photodiode for avalanche operation

Johan Abautret, Jean-Philippe Pérez, Axel Evirgen et al. · Journal of Applied Physics · 2013 · 30 citations

Wide-bandgap Semiconductor, Electrical Engineering, Photoelectric Sensor +15