J. Rhayem

Low frequency noise in thin film transistors

D. Rigaud, J. Rhayem, M. Valenza · IEE Proceedings - Circuits Devices and Systems · 2002 · 63 citations

Device Modeling, Electrical Engineering, Engineering +12

1/f noise investigations in small channel length amorphous silicon thin film transistors

J. Rhayem, M. Valenza, D. Rigaud et al. · Journal of Applied Physics · 1998 · 44 citations

Small Channel, Engineering, Low-frequency Noise +16

1/f noise modeling in long channel amorphous silicon thin film transistors

J. Rhayem, D. Rigaud, M. Valenza et al. · Journal of Applied Physics · 2000 · 43 citations

Device Modeling, Semiconductor Technology, Electrical Engineering +12

1/f Noise in amorphous silicon thin film transistors: effect of scaling down

J. Rhayem, D. Rigaud, M. Valenza et al. · Solid-State Electronics · 1999 · 26 citations

Electrical Engineering, Engineering, Applied Physics +4

1/f noise in metal–oxide–semiconductor transistors biased in weak inversion

J. Rhayem, D. Rigaud, A. Eya’a et al. · Journal of Applied Physics · 2001 · 21 citations

Device Modeling, Electrical Engineering, Engineering +8