Ryan M. Diestelhorst

Multiple-Bit Upset in 130 nm CMOS Technology

Alan D. Tipton, Jonathan A. Pellish, Robert A. Reed et al. · IEEE Transactions on Nuclear Science · 2006 · 102 citations

Engineering, Vlsi Design, Mem Testing +18

An Investigation of Dose Rate and Source Dependent Effects in 200 GHz SiGe HBTs

Akil K. Sutton, A. P. Gnana Prakash, Bongim Jun et al. · IEEE Transactions on Nuclear Science · 2006 · 56 citations

Engineering, Radiation Exposure, Source Dependent Effects +24

Substrate Engineering Concepts to Mitigate Charge Collection in Deep Trench Isolation Technologies

Jonathan A. Pellish, Robert A. Reed, Ronald D. Schrimpf et al. · IEEE Transactions on Nuclear Science · 2006 · 47 citations

Electrical Engineering, Engineering, Deep Trench Isolation +15

CMOS reliability issues for emerging cryogenic Lunar electronics applications

Tianbing Chen, Chendong Zhu, Laleh Najafizadeh et al. · Solid-State Electronics · 2006 · 41 citations

Reliability, Electrical Engineering, Engineering +6

Laser-Induced Current Transients in Silicon-Germanium HBTs

Jonathan A. Pellish, Robert A. Reed, Dale McMorrow et al. · IEEE Transactions on Nuclear Science · 2008 · 40 citations

Transient Grating, Photonics, Electrical Engineering +14