Naoki Tega

Anomalously Large Threshold Voltage Fluctuation by Complex Random Telegraph Signal in Floating Gate Flash Memory

Naoki Tega, Hiroshi Miki, T. Osabe et al. · 2006 · 93 citations

Non-volatile Memory, Electrical Engineering, Engineering +9

Impact of threshold voltage fluctuation due to random telegraph noise on scaled-down SRAM

Naoki Tega, Hiroshi Miki, Masanao Yamaoka et al. · 2008 · 90 citations

Engineering, Vlsi Design, Capture Cross Section +16

Statistical measurement of random telegraph noise and its impact in scaled-down high-κ/metal-gate MOSFETs

Hiroshi Miki, Naoki Tega, Masanao Yamaoka et al. · 2012 · 62 citations

Hardware Security, Statistical Measurement, Electrical Engineering +14

Increasing threshold voltage variation due to random telegraph noise in FETs as gate lengths scale to 20 nm

Naoki Tega, Hiroshi Miki, F. Pagette et al. · 2006 · 35 citations

Device Modeling, Threshold Voltage Variation, Electrical Engineering +14

Understanding short-term BTI behavior through comprehensive observation of gate-voltage dependence of RTN in highly scaled high-κ / metal-gate pFETs

H. Miki, Masami Yamaoka, Naoki Tega et al. · 2011 · 26 citations

Device Modeling, Semiconductor Technology, Electrical Engineering +14