Hiroshi Miki

Anomalously Large Threshold Voltage Fluctuation by Complex Random Telegraph Signal in Floating Gate Flash Memory

Naoki Tega, Hiroshi Miki, T. Osabe et al. · 2006 · 93 citations

Non-volatile Memory, Electrical Engineering, Engineering +9

Impact of threshold voltage fluctuation due to random telegraph noise on scaled-down SRAM

Naoki Tega, Hiroshi Miki, Masanao Yamaoka et al. · 2008 · 90 citations

Engineering, Vlsi Design, Capture Cross Section +16

The effects of the catalytic nature of capacitor electrodes on the degradation of ferroelectric Pb(Zr,Ti)O3 thin films during reductive ambient annealing

Yoshihisa Fujisaki, Keiko Kushida-Abdelghafar, Yasuhiro Shimamoto et al. · Journal of Applied Physics · 1997 · 76 citations

Materials Engineering, Materials Science, Chemical Engineering +14

Statistical measurement of random telegraph noise and its impact in scaled-down high-κ/metal-gate MOSFETs

Hiroshi Miki, Naoki Tega, Masanao Yamaoka et al. · 2012 · 62 citations

Hardware Security, Statistical Measurement, Electrical Engineering +14

Evaluation methodology for random telegraph noise effects in SRAM arrays

Masanao Yamaoka, Hiroshi Miki, Aditya Bansal et al. · 2011 · 45 citations

Hardware Security, Electrical Engineering, Rtn Effects +14