Hiroshi Miki

Anomalously Large Threshold Voltage Fluctuation by Complex Random Telegraph Signal in Floating Gate Flash Memory

Naoki Tega, Hiroshi Miki, T. Osabe et al. · 2006 · 93 citations

Engineering, Computer Engineering, Electrical Engineering +13

Impact of threshold voltage fluctuation due to random telegraph noise on scaled-down SRAM

Naoki Tega, Hiroshi Miki, Masanao Yamaoka et al. · 2008 · 90 citations

Engineering, Computer Engineering, Electrical Engineering +17

The effects of the catalytic nature of capacitor electrodes on the degradation of ferroelectric Pb(Zr,Ti)O3 thin films during reductive ambient annealing

Yoshihisa Fujisaki, Keiko Kushida-Abdelghafar, Yasuhiro Shimamoto et al. · Journal of Applied Physics · 1997 · 77 citations

Natural Sciences, Materials Engineering, Materials Science +17

Statistical measurement of random telegraph noise and its impact in scaled-down high-κ/metal-gate MOSFETs

Hiroshi Miki, Naoki Tega, Masanao Yamaoka et al. · 2012 · 62 citations

Engineering, Electrical Engineering, Microelectronics +16

Evaluation methodology for random telegraph noise effects in SRAM arrays

Masanao Yamaoka, Hiroshi Miki, Aditya Bansal et al. · 2011 · 45 citations

Engineering, Computer Engineering, Electrical Engineering +17