Keiko Kushida-Abdelghafar

Electrode-induced degradation of Pb(Zr<i>x</i>Ti1−<i>x</i>)O3 (PZT) polarization hysteresis characteristics in Pt/PZT/Pt ferroelectric thin-film capacitors

Keiko Kushida-Abdelghafar, Hiroshi Miki, Kazuyoshi Torii et al. · Applied Physics Letters · 1996 · 134 citations

Natural Sciences, Materials Engineering, Materials Science +17

H 2 damage of ferroelectric Pb(Zr,Ti)O3 thin-film capacitors—The role of catalytic and adsorptive activity of the top electrode

Y. Shimamoto, Keiko Kushida-Abdelghafar, H. Miki et al. · Applied Physics Letters · 1997 · 133 citations

Natural Sciences, Materials Engineering, Materials Science +17

The effects of the catalytic nature of capacitor electrodes on the degradation of ferroelectric Pb(Zr,Ti)O3 thin films during reductive ambient annealing

Yoshihisa Fujisaki, Keiko Kushida-Abdelghafar, Yasuhiro Shimamoto et al. · Journal of Applied Physics · 1997 · 77 citations

Natural Sciences, Materials Engineering, Materials Science +17

Interface structures generated by negative-bias temperature instability in Si/SiO2 and Si/SiOxNy interfaces

Jiro Ushio, Takuya Maruizumi, Keiko Kushida-Abdelghafar · Applied Physics Letters · 2002 · 70 citations

Natural Sciences, Materials Science, Physics +17

Effect of nitrogen at SiO2/Si interface on reliability issues—negative-bias-temperature instability and Fowler–Nordheim-stress degradation

Keiko Kushida-Abdelghafar, Kikuo Watanabe, Jiro Ushio et al. · Applied Physics Letters · 2002 · 70 citations

Engineering, Electrical Engineering, Materials Science +17